Better understand your devices
You can use Renishaw's Raman systems to examine and characterise all the main current and emerging PV materials (Si-based, CIGS, CdTe, organics, III-Vs, etc). The key material properties you can determine are:
-
alloy fraction
-
electronic efficiency
-
strain/stress
-
thin film thickness
-
crystal structure type and orientation
-
crystal quality
-
sample uniformity and purity (e.g. defects and contaminants)
Any device size
Analyse the final device to determine the effect production processes have on quality and performance. Renishaw offers a range of options to accommodate devices of different sizes. For the largest requirements, we specialise in producing free-space microscopes and bespoke solutions. These can be used to perform complete module analysis.